The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Oct. 11, 2022
Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Yilun Chen, Dallas, TX (US);

Ravi Kumar Dalal, Dallas, TX (US);

Adam Cantor, Austin, TX (US);

Monisha Elumalai, Dallas, TX (US);

Benjamin R. Ellison, San Francisco, CA (US);

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/087 (2023.01); G06T 5/73 (2024.01); G06T 7/11 (2017.01); G06V 10/75 (2022.01); G06V 20/00 (2022.01); G06V 20/62 (2022.01); G06V 30/148 (2022.01);
U.S. Cl.
CPC ...
G06Q 10/087 (2013.01); G06T 5/73 (2024.01); G06T 7/11 (2017.01); G06V 10/75 (2022.01); G06V 20/36 (2022.01); G06V 20/62 (2022.01); G06V 30/153 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20132 (2013.01);
Abstract

Some embodiments provide systems comprising: a machine learning model database; a deblur system configured to receive at least a portion of an image comprising a presumed location label captured by the image capture device, and apply at least a deblurring machine learning framework to generate a deblurred label image comprising the presumed location label; a rectification system configured to apply an machine learning transform algorithm to the deblurred label image to generate a rectified label image; an optical character recognition (OCR) system configured to apply a recognition machine learning model to the rectified label image to estimate text; and a location estimation system configured to estimate a location of the presumed location label as a function of the estimated text of the presumed location label relative to known text on known location labels position at respective different known locations within the product storage facility.


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