The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Jul. 15, 2021
Applicant:

Mastercard International Incorporated, Purchase, NY (US);

Inventors:

James Conway, Dublin, IE;

Quentin Bragard, Dublin, IE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/067 (2023.01); G06Q 20/20 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/067 (2013.01); G06Q 20/202 (2013.01);
Abstract

A computer-implemented method for testing a model indicating a parametric relationship between a plurality of channels of multivariate data, the method comprising: obtaining a real dataset of observed multivariate data comprising the plurality of channels; generating a control dataset of multivariate data comprising the plurality of channels, the control dataset being generated based on the model; for each of a plurality of sample subsets from the real dataset and the control dataset, calculating a p-value for the model; and determining whether (1) a distribution difference characteristic of a distribution of the obtained p-values for sample subsets of the real dataset and a distribution of the obtained p-values for sample subsets of the control dataset falls within a second predetermined significance range, and, if condition (1) is met, determining that the model is accurate.


Find Patent Forward Citations

Conway, James. (2026). Computer-implemented method and system for testing a model (U.S. Patent No. 12591836). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12591836

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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