The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Feb. 21, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Seshu Tirupathi, Dublin, IE;

Amadou BA, Navan, IE;

Marco Luca Sbodio, Castaheany, IE;

Yufang Hou, Dublin, IE;

Venkata Sitaramagiridharganesh Ganapavarapu, Elmsford, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01);
Abstract

An embodiment for automatically forecasting and mitigating concept drift in machine learning models using natural language processing. The embodiment may automatically detect features and variables considered by a target machine learning model. The embodiment may automatically store and update a configurable corpus of relevant documents pertaining to a domain of the target machine learning model. The embodiment may automatically extract event types and corresponding time stamps from the configurable corpus of relevant documents. The embodiment may automatically correlate the extracted event types with drift detection probabilities to detect expected concept drift in the target machine learning model at a given timestamp. The embodiment may automatically generate an ensemble of replacement models based on probabilities derived from a historical database of models including corresponding keys given by event types. The embodiment may automatically retrain or replace the target machine learning model at the given timestamp.


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