The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Sep. 29, 2022
International Business Machines Corporation, Armonk, NY (US);
Yuya Jeremy Ong, San Jose, CA (US);
Aly Megahed, San Jose, CA (US);
Mark S. Squillante, Greenwich, CT (US);
Yingdong Lu, Yorktown Heights, NY (US);
Yitao Liang, Sherman Oaks, CA (US);
Pravar Mahajan, Sunnyvale, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, and computer program products for a joint prediction and improvement framework for machine learning models are provided herein. A method includes obtaining a machine learning model initialized with a set of parameters; identifying one or more actions based on test inputs corresponding to the machine learning model and historical actions related to a task, where the historical actions are dependent on respective historical outputs of the machine learning model; using the identified one or more actions to jointly compute: one or more first values corresponding to inference loss for the machine learning model; and one or more second values based at least in part on a computing cost function associated with the task; and updating the set of parameters of the machine learning model based on the one or more first values and the one or more second values.