The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Nov. 06, 2023
Sap SE, Walldorf, DE;
Haipeng Wu, Shanghai, CN;
Fen Li, Shanghai, CN;
Lei Wang, Shanghai, CN;
Feng Zhang, Shanghai, CN;
Lai Wei, Shanghai, CN;
Yunfeng Jiang, Shanghai, CN;
SAP SE, Walldorf, DE;
Abstract
Systems and methods described herein relate to the prediction of effects of data purging on data sources that are related through hierarchical data relationships. A purge request comprises a set of purge parameters that identify a data source and define one or more purge criteria for purging of data items of the data source. A plurality of impacted data sources is identified based on one or more hierarchical data relationships held by the data items of the data source. The impacted data sources include the data source and one or more additional data sources. The purge parameters are provided to a machine learning model to obtain output indicative of a predicted effect of execution of the purge request on the impacted data sources. The predicted effect is caused to be presented at the user device prior to the execution of the purge request.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile