The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

May. 25, 2021
Applicant:

Daicel Corporation, Osaka, JP;

Inventors:

Hiroki Oka, Tokyo, JP;

Koichi Yamano, Tokyo, JP;

Fumihiro Miyoshi, Tokyo, JP;

Hiroyasu Kondo, Tokyo, JP;

Hidetoshi Kozono, Tokyo, JP;

Assignee:

DAICEL CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0275 (2013.01); G05B 19/4183 (2013.01); G05B 19/4184 (2013.01);
Abstract

An abnormal irregularity cause identifying device includes a process data acquisition unit that reads, from a storage device storing process data, the pieces of process data, an abnormality determination unit that calculates an abnormality degree representing an extent of an irregularity of process data of the pieces of process data read by the process data acquisition unit, and a cause diagnosis unit that determines, for each of the pieces of process data output by the corresponding one of the plurality of sensors, whether the abnormality degree calculated by the abnormality determination unit satisfies a predetermined criterion by using causal relation information defining a combination of a causal relation between a cause and the irregularity, which appears as an influence resulting from the cause, of the process data output by each of the plurality of sensors in a hierarchical manner along time series.


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