The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jul. 11, 2022
Neurala, Inc., Boston, MA (US);
Carl Palme, Charlestown, MA (US);
Carly Franca, Boston, MA (US);
Graham Voysey, Brighton, MA (US);
Massimiliano Versace, Milton, MA (US);
Santiago Olivera, Brookline, MA (US);
Vesa Tormanen, Roslindale, MA (US);
Alireza Majidi, Medford, MA (US);
Yiannis Papadopoulos, Waltham, MA (US);
Neurala, Inc., Boston, MA (US);
Abstract
Industrial quality control is challenging for artificial neural networks (ANNs) and deep neural networks (DNNs) because of the nature of the processed data: there is an abundance of consistent data representing good products, but little data representing bad products. In quality control, the task is changed from conventional DNN task of 'recognize what I learned best' to “recognize what I have never seen before.” Lifelong DNN (L-DNN) technology is a hybrid semi-supervised neural architecture that combines the ability of DNNs to be trained, with high precision, on known classes, while being sensitive to any number of unknown classes or class variations. When used for industrial inspection, L-DNN exploits its ability to learn with little and highly unbalanced data. L-DNN's real-time learning capability takes advantage of rare cases of poor-quality products that L-DNN encounters after deployment. L-DNN can be applied to industrial inspections and manufacturing quality control.