The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Nov. 14, 2024
Applicant:

Vieworks Co., Ltd., Anyang-si, KR;

Inventors:

Byeongyeon Kim, Suwon-si, KR;

Yeonhee Park, Namyangju-si, KR;

Assignee:

Vieworks Co., Ltd., Anyang-si, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/08 (2006.01); G02B 21/00 (2006.01); H04N 23/67 (2023.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); H04N 23/675 (2023.01);
Abstract

An embodiment relates to a method for determining a slope of a slide in a slide scanning device, which includes: (a) obtaining, by a scanning control unit of a slide scanning device, z-stack images for at least a partial area of a sample of a slide; (b) extracting, by the scanning control unit, a z-axis location of a slice image in which a focus evaluation value has a top value of a predetermined ranking along a plurality of lines of any one of a plurality of rows or a plurality of columns of the z-stack images as a slope calculation z-axis location; and (c) calculating, by the scanning control unit, a slope by using a distance according to a location of a horizontal plane of the plurality of lines and the slope calculation z-axis location, and estimating the calculated slope as the slope of the slide.


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