The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jan. 04, 2024
Aac Optics (Changzhou) Co., Ltd., Changzhou City, CN;
Takaaki Teranishi, Osaka, JP;
AAC OPTICS (CHANGZHOU) CO., LTD., Changzhou City, CN;
Abstract
The present disclosure discloses an optical imaging system satisfying: 0.38≤f10-12/f≤0.90, −21.70≤f7-8/(d13+d15)≤−1.00, 2.00≤d17/d18≤10.00, and 1.00≤ (d1+d3)/d23'≤5.00, where f denotes a focal length of the optical imaging system; f10-12 denotes a combined focal length of the tenth lens, the eleventh lens and the twelfth lens; f7-8 denotes a combined focal length of the seventh lens and the eighth lens; d1 and d3 denotes an on-axis thickness of the first and second lens; d23′ denotes an on-axis distance from the second lens to the third lens; d13, d15 and d17 denotes an on-axis thickness of the seventh, eighth, and ninth lens; and d18 denotes an on-axis distance from the ninth lens to the tenth lens. The optical imaging system of the present disclosure has good optical performance, variable aperture and low distortion, and can change the depth of field during measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile