The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Sep. 15, 2021
Applicant:

Beijing Voyager Technology Co., Ltd., Beijing, CN;

Inventors:

Wenbin Zhu, Beijing, CN;

An-Chun Tien, Mountain View, CA (US);

Chao Wang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/04 (2020.01); G01S 7/481 (2006.01); G01S 7/484 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 17/04 (2020.01); G01S 7/4817 (2013.01); G01S 7/497 (2013.01); G01S 7/484 (2013.01);
Abstract

Embodiments of the disclosure provide a system for controlling an emission of laser beams using a plurality of scanning patterns by an optical sensing device. The plurality of scanning patterns interleavingly cover a field of view of the optical sensing device. The system includes a controller that is configured to detect an object within a functional distance range from the optical sensing device based on a reflected first laser beam received by the optical sensing device. The first laser beam is emitted towards a first scanning point in a first scanning pattern. The controller is also configured to determine an aperture extending from the first scanning point, and control the optical sensing device to emit a second laser beam towards a second scanning point in a second scanning pattern and skip the scanning points between the first scanning point and the second scanning point in the aperture.


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