The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jun. 14, 2024
Daifuku Co., Ltd., Osaka, JP;
Daisuke Ogawa, Hinocho, JP;
Ken Tokunaga, Hinocho, JP;
Masaki Hirano, Hinocho, JP;
Akira Murota, Hinocho, JP;
Daifuku Co., Ltd., Osaka, JP;
Abstract
An abnormality locating system includes a display device, a controller, and a storage storing map data of a power feeder. The controller includes a distance information obtainer that obtains distance information indicating a distance from a power supply to a location of the abnormality, and an abnormality site display processor. The abnormality site display processor performs an abnormality site estimation process of estimating a location of an abnormality site based on the distance information, the abnormality site is a site of the abnormality of the thermal line, and a display process of causing the display device to display a map indicating a position of the thermal line based on the map data and to display, on the map, an estimated position of the abnormality site estimated through the abnormality site estimation process.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile