The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jul. 17, 2025
China Jiliang University, Hangzhou, CN;
Xiukun Hu, Hangzhou, CN;
Shuai Yang, Hangzhou, CN;
Qiong Wu, Hangzhou, CN;
Hangfu Yang, Hangzhou, CN;
Jiage Jia, Hangzhou, CN;
CHINA JILIANG UNIVERSITY, Hangzhou, CN;
Abstract
The present invention discloses a reference sample suitable to calibrate a magnetic microscope's probe tip and a calibration method. The reference sample is a magnetic micro-nanostructure made of a magnetic material and formed on the surface of a substrate material, has at least one group of magnetic micro-nano structures composed of a plurality of substructures, and can generate a magnetic field with a specific spatial distribution on the surface of the sample. The reference sample is used to calibrate a magnetic microscope's probe tip. The magnetic material is configured to provide magnetic micro-nano structures that contain a variety of spatial feature size patterns, which can generate a stable magnetic field with specific spatial distribution on the sample surface. The present invention can broaden the spatial frequency range for calibrating the magnetic probe and realize the quantitative measurement to magnetic fields on the surface of different magnetic micro-nano structures.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile