The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Sep. 15, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Yoko Makino, Tokyo, JP;

Masashi Shibahara, Tokyo, JP;

Toshiki Yamagata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/10 (2013.01); G01N 2035/00435 (2013.01); G01N 2035/1051 (2013.01);
Abstract

An automatic analysis device includes a control unit, a switch, a reagent jacket, and a sliding contact mechanism. The control unit is configured to drive a motor that rotates the rotation shaft to rotate the reagent jacket. The switch is configured to switch the sliding contact mechanism between a state of the scraper being in contact with an inner wall surface of the housing and a state of the scraper being spaced away from the inner wall surface of the housing. The reagent jacket has a hole blocking part positioned beneath the dispensing hole. The sliding contact mechanism is provided on the hole blocking part.


Find Patent Forward Citations

Makino, Yoko. (2026). Automatic analysis device (U.S. Patent No. 12590980). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12590980

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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