The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
May. 17, 2023
Applicant:
National Institute of Meteorological Sciences, Seogwipo-si, KR;
Inventors:
Hyeong Jun Jo, Jeju-si, KR;
Sungho Choo, Seogwipo-si, KR;
Kiryong Kang, Seogwipo-si, KR;
Chulkyu Lee, Seoul, KR;
Kyungsuck Ko, Mokpo-si, KR;
Assignee:
NATIONAL INSTITUTE OF METEOROLOGICAL SCIENCES, Seogwipo-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/18 (2006.01);
U.S. Cl.
CPC ...
G01N 33/18 (2013.01);
Abstract
Provided is a conductivity temperature depth (CTD) observation information calibrating method and the CTD observation information calibrating method incudes receiving CTD observation raw information; calibrating the CTD observation raw information; and outputting calibrated CTD observation information.
Jo, Hyeong. (2026). Method and apparatus for calibrating ctd observation information (U.S. Patent No. 12590937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12590937
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile