The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Mar. 12, 2024
Ishida Co., Ltd., Kyoto, JP;
Kazuyuki Sugimoto, Ritto, JP;
Keisuke Yoshida, Ritto, JP;
Futoshi Yurugi, Ritto, JP;
Osamu Hirose, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
The X-ray inspection apparatus includes a conveying unit configured to convey an article, an X-ray source configured to irradiate the article conveyed by the conveying unit with X-rays, an X-ray detection unit capable of detecting the X-rays by photon counting, and an inspection unit configured to inspect the article based on an output result of the X-ray detection unit, where, in a sensitivity correction of the X-ray detection unit performed when the X-ray inspection apparatus is activated, after a lapse of a predetermined period from a start of detection of X-rays, the X-ray detection unit is configured to detect X-rays not transmitting the article, and the X-ray source is configured to start X-ray irradiation during the predetermined period, and where the predetermined period is equal to or longer than a period in which irradiation of the X-ray source is stabilized.