The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Nov. 30, 2022
Ishida Co., Ltd., Kyoto, JP;
Keisuke Yoshida, Ritto, JP;
Futoshi Yurugi, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes a transport unit configured to transport an article, an electromagnetic wave irradiation unit configured to irradiate the article with a first electromagnetic wave in a first energy band and a second electromagnetic wave in a second energy band, an electromagnetic wave sensor configured to detect the first electromagnetic wave and the second electromagnetic wave, and a control unit to which a detection result is input. The control unit is configured to generate a first transmission image based on a detection result of the first electromagnetic wave and a second transmission image based on a detection result of the second electromagnetic wave, to perform image processing including a subtraction process on the first transmission image and the second transmission image, and to determine whether or not a foreign material is included in the article on the basis of a difference image.