The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Sep. 22, 2023
Applicant:

Gemological Institute of America, Inc. (Gia), Carlsbad, CA (US);

Inventors:

Tsung-Han Tsai, Maywood, NJ (US);

Hiroshi Takahashi, Morristown, NJ (US);

Mehdi Toosi, Clifton, NJ (US);

Yong Liu, Edison, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/958 (2006.01); G06T 7/00 (2017.01); H04N 23/95 (2023.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G01N 21/958 (2013.01); G06T 7/0002 (2013.01); H04N 23/95 (2023.01); G01N 2021/8812 (2013.01); G01N 2021/8822 (2013.01); G01N 2021/8867 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/0634 (2013.01); G01N 2201/105 (2013.01); G01N 2201/126 (2013.01); G01N 2201/127 (2013.01);
Abstract

Systems and methods here may be used for a setup of image capturing of a gemstone, such as a diamonds that are of high clarity grades. The present embodiments can provide methods to capture a diamond surface and internal clarity features from a diamond table and through and of other facets. Systems and methods may be used to convert gemstone dimension information into azimuth, slope, and distance information and adjust the motorized stage accordingly for surface imaging. Further, a calibration method can consider the offsets between design and actual system alignment. A calibration process can be used to compensate the offsets. Further, an additional conversion can be derived to compensate the offset caused by the geometry of the gemstone. The methods can automatically capture surface reflection images on facets of the gemstone and internal features taken through facets of the gemstone.


Find Patent Forward Citations

Tsai, Tsung-Han. (2026). High clarity gemstone facet and internal imaging analysis (U.S. Patent No. 12590902). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12590902

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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