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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12590901 B1

PDFFull Text
Date of Patent:
Mar. 31, 2026

Filed:

Mar. 15, 2023

Method for inspecting a coated surface for coating defects

Applicant:

Evonik Operations Gmbh, Essen, DE;

Inventors:

Philipp Isken, Altenberge, DE;

Simon Heeg, Griesheim, DE;

Claudia Jansen, Leverkusen, DE;

Claudia Bramlage, Essen, DE;

Udo Goecke, Frankfurt am Main, DE;

Oliver Kroehl, Cologne, DE;

Stefan Silber, Krefeld, DE;

Gaetano Blanda, Haltern am See, DE;

Assignee:

Evonik Operations GmbH, Essen, DE;

Attorney:

Harness, Dickey & Pierce, P.L.C.

Primary Examiner:

Alazar Tilahun

Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06T 7/00 (2017.01); H04N 23/51 (2023.01); H04N 23/56 (2023.01); H04N 23/60 (2023.01); H04N 23/62 (2023.01); H04N 23/667 (2023.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G06T 7/0002 (2013.01); H04N 23/51 (2023.01); H04N 23/56 (2023.01); H04N 23/62 (2023.01); H04N 23/64 (2023.01); H04N 23/667 (2023.01); G01N 2021/8427 (2013.01); G01N 2021/8809 (2013.01); G01N 2021/8835 (2013.01); G01N 2201/126 (2013.01); G06T 2200/24 (2013.01); G06T 2207/20081 (2013.01);
Abstract

The invention relates to a method for inspecting a coated surface for a surface defect. The method comprises: using () a device () for covering the coated surface to be inspected, the device being configured to create an enclosed space to isolate the surface coating to be inspected from ambient illumination in order to provide predefined photographic acquisition conditions within the enclosed space; acquiring () a photo of the coated surface being within the enclosed space; and inspecting () the photo for the presence of the surface defect.

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