The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Mar. 13, 2023
Satake Corporation, Tokyo, JP;
Shinya Fushida, Tokyo, JP;
Hiroaki Takeuchi, Tokyo, JP;
SATAKE CORPORATION, Tokyo, JP;
Abstract
A measurement apparatus includes an electromagnetic wave irradiation source, a sensor, a discrimination portion configured to discriminate the condition of the target based on a signal acquired by the sensor, and an irradiation control portion. The electromagnetic wave irradiation source includes a first irradiation source and a second irradiation source different from each other in at least one of a wavelength range of the electromagnetic wave emitted therefrom and an installation position thereof. The irradiation control portion is configured to control the electromagnetic wave irradiation source in such a manner that a first irradiation period and a second irradiation period do not overlap each other and occur alternately. The first irradiation period is a period during which the first irradiation source emits the electromagnetic wave. The second irradiation period is a period during which the second irradiation source emits the electromagnetic wave.