The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Apr. 11, 2023
Applicant:

Keio University, Tokyo, JP;

Inventors:

Hideyuki Maki, Kanagawa, JP;

Yusuke Fukazawa, Kanagawa, JP;

Assignee:

KEIO UNIVERSITY, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/55 (2014.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 21/35 (2013.01); G01N 21/55 (2013.01); G01N 21/59 (2013.01); G01N 2201/061 (2013.01);
Abstract

A configuration of a time and space-resolved infrared spectroscopic analysis which can be integrated onto a chip is provided. An infrared analysis chip includes a substrate in which a microchannel is formed, at least one of a spectroscope and a photodetector integrated onto a first surface of the substrate in an area where the microchannel is formed, and an infrared light source integrated on a second surface opposite to the first surface of the substrate, the infrared light source being positioned facing said at least one of the photodetector and the spectroscope.


Find Patent Forward Citations

Maki, Hideyuki. (2026). Infrared analysis chip, and infrared imaging device (U.S. Patent No. 12590888). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12590888

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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