The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jan. 19, 2022
Osaka University, Osaka, JP;
Kyoto Prefectural Public University Corporation, Kyoto, JP;
Katsumasa Fujita, Osaka, JP;
Kentaro Nishida, Osaka, JP;
Hikaru Sato, Osaka, JP;
Hideo Tanaka, Kyoto, JP;
Yoshinori Harada, Kyoto, JP;
OSAKA UNIVERSITY, Osaka, JP;
KYOTO PREFECTURAL PUBLIC UNVERSITY CORPORATION, Kyoto, JP;
Abstract
A diagnostic optical microscope according to the present embodiment includes at least one laser light source () configured to generate laser light for illuminating a sample () containing a light absorbing material, a lens configured to focus the laser light to be focused on the sample (), scanning means for changing a focusing position of the laser light on the sample (), and a light detector () configured to detect laser light transmitted through the sample () as signal light. A laser light intensity is changed to obtain a nonlinear region in which the laser light intensity and a signal light intensity have a nonlinear relation due to occurrence of saturation of absorption in the light absorbing material when the laser light intensity is maximized. An image is generated based on a nonlinear component of the signal light based on the saturation of absorption in the light absorbing material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile