The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Feb. 03, 2025
Trustees of Boston University, Boston, MA (US);
Ji-Xin Cheng, Newton, MA (US);
Yifan Zhu, Allston, MA (US);
Trustees of Boston University, Boston, MA (US);
Abstract
A stimulated Raman photothermal (SRP) microscope for imaging a sample. A first optical source without an optical resonator emits a pump beam. A second optical source emits an intensity-modulated Stokes beam. The Stokes beam is combined with the pump beam to form a combined beam. The combined beam is directed to the sample to induce a thermal effect caused by the stimulated Raman process. A third optical source emits a probe beam, the probe beam is directed to the sample. An optical detector detects modulation of the probe beam after modulation by the sample to measure an SRP signal. Because noise in the pump and Stokes beam do not significantly effect the measurements from the probe beam, these beams can use a high-powered optical parametric amplifier (OPA) source for improved sensitivity and imaging speed compared to SRP microscopes using an optical parametric oscillator (OPO) source.