The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Sep. 27, 2023
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventor:

Matthew P. Gordon, Berkeley, CA (US);

Assignees:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 4/1395 (2010.01); G01N 15/0205 (2024.01); G01N 21/88 (2006.01); G01N 21/89 (2006.01); G01N 21/94 (2006.01); G01N 21/95 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 21/94 (2013.01); G01N 21/95 (2013.01); H01M 4/1395 (2013.01); G01N 2015/0061 (2013.01); G01N 2021/8861 (2013.01); G01N 2021/8909 (2013.01);
Abstract

One form of a metallic particle detection system detects automatically, through analysis of image data from a first sensor, a foreign metallic particle in or on an active material layer of an electrode strip moving between a section and a subsequent section on a roll-to-roll coated electrode manufacturing line that manufactures a plate electrode. The system also determines a position of the foreign metallic particle on the electrode strip moving on the roll-to-roll coated electrode manufacturing line. The system also triggers, in response to detection of the foreign metallic particle and based on the position of the foreign metallic particle and a speed at which the electrode strip is moving, the second sensor, the second sensor generating a reflectance spectrum of the foreign metallic particle. The system also analyzes the reflectance spectrum to identify a type of metal of which the foreign metallic particle is composed.


Find Patent Forward Citations

Gordon, Matthew. (2026). Systems and methods for detecting foreign metallic particles (U.S. Patent No. 12590878). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12590878

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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