The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Nov. 10, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Naoya Sogi, Tokyo, JP;

Makoto Terao, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/163 (2013.01); B25J 9/1664 (2013.01);
Abstract

Provided is a technique that makes it possible, as evaluation of a control plan with respect to a control target, to evaluate a plan sequence while taking into consideration long-term influence. An information processing apparatus includes: an acquisition section that acquires state information and a plan sequence, the state information indicating a state of at least one of a control target and an environment, and the plan sequence being a time series of control plans with respect to the control target; a generation section that generates a state sequence using output obtained by inputting the state information and the plan sequence into a learned model, the state sequence being a time series of pieces of state information each indicating a predicted future state; and a calculation section that calculates, using the state sequence, a success probability of the plan sequence which has been acquired by the acquisition section.


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