The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Mar. 11, 2022
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Wolf Weimer, Jena, DE;

Gregor Stobrawa, Jena, DE;

Mark Bischoff, Jena, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 17/00 (2006.01); A61F 9/009 (2006.01); G01M 11/08 (2006.01);
U.S. Cl.
CPC ...
A61F 9/009 (2013.01); G01M 11/08 (2013.01); A61B 2017/00154 (2013.01); A61B 2017/00725 (2013.01);
Abstract

A method for carrying out a system test of a laser processing system is disclosed. The method includes the execution of a functional test of a control element of the laser processing system. The method further includes the determination of a variable parameter and the determination of an influence of the determined variable parameter on an intended execution of a laser processing by means of the laser processing system. The execution of the functional test of the control element and the determination of the variable parameter overlap at least partially in time.


Find Patent Forward Citations

Weimer, Wolf. (2026). Method for carrying out a system test of a laser processing system, control unit and laser processing system (U.S. Patent No. 12589034). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12589034

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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