The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Dec. 11, 2019
GE Precision Healthcare Llc, Milwaukee, WI (US);
André De Almeida Maximo, Rio de Janeiro, BR;
Dattesh Dayanand Shanbhag, Bangalore, IN;
Chitresh Bhushan, Schenectady, NY (US);
Dawei Gui, Sussex, WI (US);
GE PRECISION HEALTHCARE LLC, Milwaukee, WI (US);
Abstract
Methods and systems are provided for determining diagnostic-scan parameters for a magnetic resonance (MR) diagnostic-scan, from MR calibration images, enabling acquisition of high-resolution diagnostic images of one or more anatomical regions of interest, while bypassing acquisition of localizer images, increasing a speed and efficiency of MR diagnostic-scanning. In one embodiment, a method for a magnetic resonance imaging (MRI) system comprises, acquiring a magnetic resonance (MR) calibration image of an imaging subject, mapping the MR calibration image to a landmark map using a trained deep neural network, determining one or more diagnostic-scan parameters based on the landmark map, acquiring an MR diagnostic image according to the diagnostic-scan parameters, and displaying the MR diagnostic image via a display device.