The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Jun. 16, 2023
Applicant:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Inventor:

Douglas Paul Fenster, Onondaga Hill, NY (US);

Assignee:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/11 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); A61B 3/111 (2013.01);
Abstract

A vision screening device for administering vision screening tests to a patient, including an oversampling sensor allowing operation of the device at various distances from a patient, is described herein. The vision screening device may include associated methods and systems configured to capture a series of oversampled images, detect the patient's face and eyes in the images, track the eyes, and output a stabilized eye image for performing the vision screening tests. The device may also be configured to determine measurements related to the positions of the eyes in the eye image, and determine, based on the measurements, if the eye image satisfies criteria for use in the vision screening tests being performed. Methods associated with the device may be configured to provide guidance to an operator of the device to adjust either the device or the patient's position so that an eye image meeting the criteria can be generated.


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