The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

May. 05, 2021
Applicant:

Heidelberg Engineering Gmbh, Heidelberg, DE;

Inventors:

Björn Martensen, Lübeck, DE;

Michaela Gaens, Dossenheim, DE;

Andreas Fritz-Bouteleux, Lübeck, DE;

Assignee:

Heidelberg Engineering GmbH, Heidelberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/107 (2006.01);
U.S. Cl.
CPC ...
A61B 3/107 (2013.01); A61B 3/1005 (2013.01);
Abstract

In view of the problem of specifying an arrangement and a method by means of which an eye can be measured preferably without artifacts and quickly, an arrangement for measuring an eye (), comprising a light source () which is suitable for emitting light rays () to the cornea () of an eye () and a control unit () which drives the light source () to emit the light rays () and is suitable for converting reflected light rays () entering the arrangement into signals (), is characterized in that the light source () when driven by the control unit () emits a central light ray () and emits a plurality of peripheral light rays () which are radially offset with respect to the central light ray () or in that the light source () when driven by the control unit () emits a plurality of peripheral light rays () radially offset with respect to one another. Moreover, a method is specified.


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