The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Oct. 31, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Thomas Valerrian Pasca Santhappan, San Diego, CA (US);

Abdelrahman Mohamed Ahmed Mohamed Ibrahim, San Diego, CA (US);

Muhammad Sayed Khairy Abdelghaffar, San Jose, CA (US);

Huilin Xu, Temecula, CA (US);

Seyedkianoush Hosseini, San Diego, CA (US);

Ahmed Attia Abotabl, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/336 (2015.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/336 (2015.01); H04W 24/08 (2013.01);
Abstract

Methods, systems, and devices for wireless communications are described. The method may include a user equipment (UE) receiving a first message indicating a configuration for measuring cross-link interference (CLI) and for reporting one or more CLI measurements. Further, the UE may receive a second message activating the configuration. Upon receiving the second message, the UE may monitor a resource during a first periodic occasion and transmit a report comprising the one or more CLI measurements during a second periodic occasion.


Find Patent Forward Citations

Santhappan, Thomas Valerrian Pasca. (2026). Joint activation of cross-link interference measurement and reporting (U.S. Patent No. 12587888). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12587888

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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