The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Jan. 09, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Yuwei Ren, Beijing, CN;

Chao Wei, Beijing, CN;

Huilin Xu, Temecula, CA (US);

Yiqing Cao, Beijing, CN;

Tingfang Ji, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/318 (2015.01); H04J 11/00 (2006.01); H04W 72/20 (2023.01); H04W 72/541 (2023.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/318 (2015.01); H04J 11/003 (2013.01); H04W 72/20 (2023.01); H04W 72/541 (2023.01);
Abstract

Methods, systems, and devices for wireless communications are described which provide for efficient backhaul communications and identification of resources for cross-link interference (CLI) measurements and reporting. A common resource pool may be configured in which CLI measurements for resources within the resource pool have a common configuration. When providing information indicating resources that are to be measured for CLI, a bitmap that indicates resources within the common resource pool may be provided with CLI measurement configurations corresponding to the common resource pool configuration. Such a bitmap may be communicated via backhaul connections between neighboring base stations when initiating a CLI measurement. Various described techniques also provide for common configuration for CLI measurements, provide for efficient reporting of CLI measurements, and provide for accurate representation of CLI based on measurements at a victim UE.


Find Patent Forward Citations

Ren, Yuwei. (2026). Measurement and reporting for ue-to-ue interference (U.S. Patent No. 12587887). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12587887

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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