The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Feb. 09, 2024
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hitoshi Sakurabu, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/704 (2023.01); H04N 25/42 (2023.01);
U.S. Cl.
CPC ...
H04N 25/704 (2023.01); H04N 25/42 (2023.01);
Abstract

There is provided an imaging apparatus configured to: execute a first mode that is a mode related to focusing on a subject and in which focusing information of a first region is acquired by performing a first shift operation on first phase difference information, which is obtained from a first phase difference pixel group within the first region, and second phase difference information, which is obtained from a second phase difference pixel group within the first region; and execute a second mode that is a mode different from the first mode and in which distance information of a second region larger than the first region is acquired by performing a second shift operation on the first phase difference information and the second phase difference information corresponding to the second region, and a shift range in the second shift operation is smaller than a shift range in the first shift operation.


Find Patent Forward Citations

Loading…