The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
May. 29, 2024
Duke University, Durham, NC (US);
Roarke Horstmeyer, Durham, NC (US);
Shiqi Xu, Durham, NC (US);
Xiang Dai, Durham, NC (US);
Lucas Kreiss, Durham, NC (US);
Jadee Neff, Durham, NC (US);
Carolyn Glass, Durham, NC (US);
DUKE UNIVERSITY, Durham, NC (US);
Abstract
A Fourier ptychography system includes a polarization-sensitive camera positioned for capturing a sequence of polarized images of a sample, an objective lens positioned in a light path between the polarization-sensitive camera and the sample, an array of light sources for directing light to the sample and a generator polarizer positioned between the array of light sources and the sample to polarize light directed to the sample from the array of light sources. A method of creating a tomographic Fourier ptychography image includes receiving, from a polarization-sensitive camera, a sequence of polarized images of a sample, stitching each image of the sequence of images together using a non-linear Fourier transform function to create a composite image, and outputting the composite image as the tomographic Fourier ptychography image. Each polarized image of the sequence of polarized images overlaps another polarized image of the sequence of polarized images.