The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Dec. 19, 2023
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei City, TW;

Inventors:

Jing-Lun Huang, Taipei City, TW;

Yu-Lun Chang, Taipei City, TW;

Wei-Chao Chen, Taipei City, TW;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/52 (2022.01); G06V 10/22 (2022.01); G06V 10/44 (2022.01); G06V 10/62 (2022.01); G06V 20/40 (2022.01);
U.S. Cl.
CPC ...
G06V 20/52 (2022.01); G06V 10/235 (2022.01); G06V 10/454 (2022.01); G06V 10/62 (2022.01); G06V 20/44 (2022.01); G06V 20/46 (2022.01);
Abstract

A system for detecting an event occurrence period of cyclical event includes an image monitoring device and a period judgment device. The image monitoring device captures monitoring images respective in image capturing times. The period judgment device extracts feature vectors from the monitoring images to calculate vector values to accordingly generate a vector value time domain signal, executes a short-time Fourier transform (STFT) with a window width time to transform the vector value time domain signal to a spectrogram, makes the spectrogram be denoised to generate a representative frequency time domain signal, and calculates an event-cycle achievement rate and a product term accumulation number after each window width time, so as to accordingly calculate event occurrence time and the event occurrence period.


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