The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Jun. 23, 2023
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Jonathan H. Goldstein, Fredericksburg, VA (US);

Lauren E. Turney, Forney, TX (US);

Richard W. Ely, Lewisville, TX (US);

Jody D. Verret, Rockwall, TX (US);

Brett N. Appleton, Centreville, VA (US);

Assignee:

Raytheon Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06N 3/094 (2023.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G06N 3/094 (2023.01); G06V 10/82 (2022.01);
Abstract

A method includes obtaining training data having first image pairs, where each of the first image pairs includes (i) a first training image and (ii) a first ground truth image. The method also includes training a machine learning model to generate realistic images using the first image pairs. The method further includes obtaining additional training data having second image pairs, where each of the second image pairs includes (i) a second training image and (ii) a second ground truth image. At least some of the images in the second image pairs are less aligned or of lower quality than at least some of the images in the first image pairs. In addition, the method includes continuing to train the machine learning model to generate the realistic images using the second image pairs.


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