The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Dec. 21, 2023
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Junghyun Cho, Seoul, KR;

Ig Jae Kim, Seoul, KR;

Seok Yeong Lee, Seoul, KR;

Jun Yong Choi, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/20 (2011.01); G06T 7/30 (2017.01); G06T 7/90 (2017.01); G06T 15/50 (2011.01);
U.S. Cl.
CPC ...
G06T 15/205 (2013.01); G06T 7/30 (2017.01); G06T 7/90 (2017.01); G06T 15/506 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

The present disclosure relates to an apparatus and a method for generating an image, which may generate a new viewpoint image using few-shot 2D images and is characterized by extracting and learning albedo representing intrinsic color information from the few-show 2D input images, intrinsically decomposing a color value synthesized in the form of patch from a new viewpoint using the few-shot 2D input images and extracting patch-wise albedo during learning, perform geometric alignment necessary for pixel correspondence between a new viewpoint image and a selected 2D input image using a depth value synthesized in the form of patch from the new viewpoint, and generating the new viewpoint image by calculating an albedo consistency loss between the patch-wise albedo.


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