The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Jan. 16, 2025
Zhejiang Hengyi Petrochemical Co., Ltd., Hangzhou, CN;
Hangzhou Yichen Chemical Fiber Co., Ltd., Hangzhou, CN;
Xiantao Peng, Hangzhou, CN;
Peng Wang, Hangzhou, CN;
Yibo Qiu, Hangzhou, CN;
Dake Li, Hangzhou, CN;
Mingyi Liu, Hangzhou, CN;
Feng Xu, Hangzhou, CN;
Junliang Jin, Hangzhou, CN;
ZHEJIANG HENGYI PETROCHEMICAL CO., LTD., Hangzhou, CN;
HANGZHOU YICHEN CHEMICAL FIBER CO., LTD., Zhejiang, CN;
Abstract
A method for processing yarn spindle data, an electronic device and a storage medium, relating to the field of data processing technology, are provided. The method includes: after determining that a yarn spindle is transported into a detection area, performing a defect detection on the yarn spindle located in the detection area to obtain a target detection result of the yarn spindle. The target detection result is used to characterize a defect degree of the yarn spindle. The method further includes: after determining that the target detection result meets a preset defect value, obtaining a target level of the yarn spindle based on the target detection result of the yarn spindle and a preset level of the yarn spindle.