The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Mar. 30, 2023
Fujifilm Corporation, Tokyo, JP;
Shuhei Horita, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a structure diagnostic case presentation device, method, and program capable of performing support such that a diagnostician can make a more appropriate diagnosis in diagnosing damage of a target structure to be diagnosed. In a case where information (damage information) regarding the target structure to be diagnosed is acquired by a first information acquisition unit (), a similar damage extraction unit (-) extracts similar damage similar to the damage of the target structure from a database () based on the acquired damage information. A specific diagnostic case extraction unit (-) extracts, as a specific diagnostic case, a diagnostic result that is a diagnostic result of a structure having the extracted similar damage and is a diagnostic result of a structure having different diagnostic results at two points in time or more, from the database (). Information related to the extracted specific diagnostic case is displayed on a display unit ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile