The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

May. 18, 2022
Applicant:

Fujitsu Limited, Kanagawa, JP;

Inventors:

Wing Yee Au, Saratoga, CA (US);

Kanji Uchino, Santa Clara, CA (US);

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 16/901 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/211 (2019.01); G06F 16/9024 (2019.01);
Abstract

According to an aspect of an embodiment, operations may include retrieving a first graph. The operations may further include identifying a set of node-types, determining a first count of each of the identified set of node-types, and determining first statistical information. The operations may further include identifying a set of edge-types, determining a second count of each of the identified set of edge-types and determining a two-dimensional (2D) distribution of each of the identified set of edge-types. The operations may further include determining second statistical information, identifying a set of combinations of edge-types connecting three node-types and determining a third count of each of a set of three node-type groups. The operations may further include determining a three-dimensional (3D) distribution of each of the set of three node-type groups, determining third statistical information, and transmitting first graph statistics associated with the retrieved first graph for generation a second graph.


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