The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Apr. 22, 2021
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Satish Kumar Mopur, Bangalore, IN;

Sridhar Balachandriah, Bangalore, IN;

Krishnaprasad Lingadahalli Shastry, Bangalore, IN;

Maximilian Classen, Ratingen, DE;

Milind B Desai, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/22 (2023.01); G06F 18/2321 (2023.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/22 (2023.01); G06F 18/2321 (2023.01); G06V 10/751 (2022.01);
Abstract

A system and a method for updating a Machine Learning (ML) model are described The method involves capturing reconstruction errors associated with reconstruction of images by a pre-trained autoencoder. Data points representing the reconstruction errors are clustered using affinity propagation. A preference value used by the affinity propagation for determining similarity between the data points is dynamically set through linear regression. Outliers and data drifts are determined from clusters of the data points. Classification output of the ML model is associated with the outliers and the data drift, for refinement of the ML model over a device hosting a training environment.


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