The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Oct. 27, 2022
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Jiangyong Ying, Shenzhen, CN;

Xiongwei Zhu, Shenzhen, CN;

Jing Gao, Beijing, CN;

Lei Chen, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06V 10/40 (2022.01); G06V 10/82 (2022.01); G06V 20/40 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06V 10/40 (2022.01); G06V 10/82 (2022.01); G06V 20/40 (2022.01);
Abstract

This application discloses a data processing system, an object detection method, and an apparatus thereof, and is applied to the artificial intelligence field. In this application, a second feature map generation unit introduces shallow texture detail information of an original feature map (a plurality of first feature maps generated by a convolutional processing unit) into a deep feature map (a plurality of second feature maps generated by a first feature map generation unit), to generate a plurality of third feature maps, and the third feature map including the shallow rich texture detail information is used as entered data on which a detection unit is to perform target detection.


Find Patent Forward Citations

Ying, Jiangyong. (2026). Data processing system, object detection method, and apparatus thereof (U.S. Patent No. 12585944). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12585944

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…