The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Mar. 28, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Michael Manhart, Fürth, DE;

Alexander Preuhs, Erlangen, DE;

Manuela Meier, Nuremberg, DE;

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/55 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/55 (2019.01);
Abstract

Systems and methods for image processing that provides an output data set on the basis of an input data set relating to an examination subject. The method includes generating an initial intermediate data set group from a plurality of intermediate data sets by applying a respective correction operation associated with the respective intermediate data set to the input data set, ordering the intermediate data sets according to a quality ranking in respect of their image quality by a sorting algorithm, wherein the intermediate data sets of the initial intermediate data set group are ordered in a first iteration, wherein, in the sorting algorithm, a respective relative quality metric for the relative image quality of a respective first of the intermediate data sets in relation to a respective second of the intermediate data sets is determined by a comparison algorithm, after which the order of the respective first and second intermediate data set in the quality ranking is specified by a comparison of the relative quality metric with a quality limit value.


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