The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Aug. 07, 2023
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Yi-Qun Ren, Shanghai, CN;

Kai Hu, Shanghai, CN;

Gen-Cheng Shen, Shanghai, CN;

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01); G06F 40/274 (2020.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 40/274 (2020.01);
Abstract

One or more characters are input into an auto-complete field. Text of a displayed list of one or more candidate items is retrieved. The text of the displayed list of the one or more candidate items is compared to a predefined candidate item. In response to the text of the displayed list of one or more candidate items not having the predefined candidate item or not being withing a defined ranking, test results are flagged where the predefined candidate item is missing from displayed list of the one or more candidate items or is not withing the defined ranking. This allows the for automated testing of the auto-complete fields.


Find Patent Forward Citations

Ren, Yi-Qun. (2026). Auto-complete testing (U.S. Patent No. 12585575). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12585575

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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