The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
May. 27, 2020
Ab Initio Technology Llc, Lexington, MA (US);
Edward Alan Bach, Melrose, MA (US);
Victor Abaya, Cambridge, MA (US);
Matthew Eads, Lexington, MA (US);
Carl Offner, Sudbury, MA (US);
Matthew Zinno, Sharon, MA (US);
Ab Initio Technology LLC, Lexington, MA (US);
Abstract
A data processing system defines a unit test for a dataflow graph comprising a plurality of executable components. The system receives an indication of a portion of a dataflow graph for testing. The system receives a parameter set indicating expected output data to be generated by execution of a component of the graph. The system receives input data for the component. The input data are indicated by the parameter set and configured to test a functionality of the component. The system defines a unit test of the component based on the parameter set. The unit test provides the input data to inputs of the dataflow graph, causes processing of the input data by the component of the dataflow graph to generate output data, and generates results data indicating a correspondence between the output data and the expected output data indicated by the parameter.