The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Nov. 15, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Markus Weber, Wetzlar, DE;
Stefan Bamberger, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A module for a microscope includes at least one sensor and/or at least one actuator, and a control and evaluation unit. The control and evaluation unit is configured to determine current parameter values of parameters of the sensor and/or of the actuator, analyze the parameter values using a statistical model stored in the control and evaluation unit to determine an operating state value that characterizes an operating state of the module, and identify the operating state as an abnormal operating state upon determining that the operating state value satisfies a predefined condition with respect to a threshold value.