The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Mar. 01, 2022
Applicant:

Ab Initio Technology Llc, Lexington, MA (US);

Inventors:

Jonathan Martin, Reading, GB;

Adam Weiss, Lexington, MA (US);

Assignee:

Ab Initio Technology LLC, Lexington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 16/215 (2019.01); G06Q 10/0631 (2023.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 16/215 (2019.01); G06Q 10/06311 (2013.01); G06Q 10/06316 (2013.01);
Abstract

Systems and methods are for executing, by a data processing system, a workflow to process results data indicating an output of a data quality test on data records by generating, responsive to receiving the results data and metadata describing the results data, a data quality issue associated with a state and one or more processing steps of the workflow to resolve a data quality error associated with the data quality test. Operations include generating a workflow for processing results data based a state specified by a data quality issue. Generating the workflow includes: assigning, based on the results data and the state of the data quality issue, an entity responsible for resolving the data quality error; determining, based on the metadata, one or more actions for satisfying the data quality condition specified in the data quality test; and updating the state associated with the data quality issue.


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