The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Dec. 20, 2023
Changzhou Aac Raytech Optronics Co., Ltd., Changzhou City, CN;
Kaoru Yamazaki, Osaka, JP;
Takashi Iwasaki, Osaka, JP;
Changzhou AAC Raytech Optronics Co., Ltd., Changzhou City, CN;
Abstract
Disclosed is a microscope objective lens including from an emitting side to an objective side: the first lens to the twelfth lens. The focal length of the microscope objective lens is f, the numerical aperture is NA, and the working distance is WD. A focal length of a lens group consisting of the first lens to the fourth lens is f1−4, and a combined focal length between the seventh lens and the eighth lens is f78. The on-axis distances of the seventh and the eighth lens are d13 and d15, and an on-axis distance from the seventh lens to the eighth lens is d14. The central radiuses of curvature of the emitting surface and the objective surface of the eleventh lens are R21 and R22, respectively. The following relationship expressions are satisfied: 0.09≤f1−4/f≤0.15; −1.35≤f78/(d13+d14+d15)≤−0.95; −7.00≤R21/R22≤−2.00; 0.20≤NA*f/WD≤0.26. This microscope objective lens has excellent optical characteristics, and low aberration.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile