The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

May. 07, 2020
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventor:

Jerg Pfeil, Cleebronn, DE;

Assignee:

ROBERT BOSCH GMBH, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 17/86 (2020.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 17/86 (2020.01); G01S 17/931 (2020.01);
Abstract

A method for optimizing a surroundings model by at least one control unit, measured data being received from a first sensor set and at least one second sensor set. The first sensor set includes a first scanning area, and the second sensor set includes a second scanning area, the first scanning area and the second scanning area partially overlapping in an overlap area. A surroundings model is created for each sensor set based on the received measured data of the particular sensor set. The at least two surroundings models are compared to one another based on the overlap area and being verified. The at least two surroundings models are combined into an optimized surroundings model. A system, a control unit, a computer program, and a machine-readable memory medium, are also described.


Find Patent Forward Citations

Pfeil, Jerg. (2026). Method for optimizing a surroundings model (U.S. Patent No. 12585017). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12585017

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…