The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Dec. 22, 2023
Applicant:

SK on Co., Ltd., Seoul, KR;

Inventors:

Ji Won Na, Daejeon, KR;

Jae Ram Kim, Daejeon, KR;

Sang Won Bae, Daejeon, KR;

Ji Hee Bae, Daejeon, KR;

Yeon Hwa Song, Daejeon, KR;

Ki Joo Eom, Daejeon, KR;

Myung Ro Lee, Daejeon, KR;

Jae Yeong Lee, Daejeon, KR;

Hyun Joong Jang, Daejeon, KR;

Assignee:

SK On Co., Ltd., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/396 (2019.01); G01R 31/3842 (2019.01); H01M 10/42 (2006.01); H02J 7/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/396 (2019.01); G01R 31/3842 (2019.01); H01M 10/4285 (2013.01); H02J 7/0048 (2020.01);
Abstract

An apparatus and method for detecting a defective battery cell is proposed. The proposed apparatus includes a charger for supplying current to cause a battery cell to maintain a constant voltage, a measurement part for measuring the voltage and current of the battery cell, and a controller for determining whether a defect exists in the battery cell on the basis of the current measured by the measurement part, whereby the defective battery cell may be detected with high accuracy, a time required for the detection may be shortened, and a space required for the detection may also be reduced.


Find Patent Forward Citations

Na, Ji. (2026). Apparatus and method for detecting defective battery cell (U.S. Patent No. 12584973). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12584973

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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