The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Jan. 09, 2024
Applicant:
National Instruments Corporation, Austin, TX (US);
Inventors:
Brian Clifford Maccleery, Austin, TX (US);
Martin Weiss, Austin, TX (US);
Assignee:
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/389 (2019.01); G01R 31/36 (2020.01); G01R 31/367 (2019.01); G01R 31/385 (2019.01);
U.S. Cl.
CPC ...
G01R 31/389 (2019.01); G01R 31/3648 (2013.01); G01R 31/367 (2019.01); G01R 31/3865 (2019.01);
Abstract
Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.