The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Oct. 27, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Yuichiro Ota, Tokyo, JP;
Kenta Imai, Tokyo, JP;
Shunsuke Sasaki, Tokyo, JP;
Hidekazu Tezuka, Tokyo, JP;
Hiroya Umeki, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
The invention has an object to provide an automatic analyzer and a control program that can shorten total analysis time. The automatic analyzer comprises: a sample rack that houses a sample; a sample dispensing mechanism that aspirates the sample from the sample rack and dispenses the sample into a reaction container; a plurality of detection units that detect a reaction liquid in the reaction container; and a control unit that controls the sample dispensing mechanism and the detection units. The control unit checks the measurement item specified for the sample and checks one of the detection units that is specified by the measurement item. When measurements specifying the same detection unit among the detection units are specified consecutively, the order of dispensing by the sample dispensing mechanism is changed so that measurements specifying different detection units are made consecutively.